This study was designed to assess the occurrence of major insects and rodent pest infestations in stored grain from two districts of Southwestern Ethiopia. Omo Nada and Bako Tibe districts were purposively selected because they are potential maize and sorghum growing regions with high postharvest losses. A total of 160 farmers’ stores from both the districts were randomly selected. The grain samples used in the present study were stored for five different time periods, ranging from 1 to 5 months and from the same farmers’ stores, to identify storage insect pest, determine grain weight loss and insect damage. The results showed that the dominant insect species in maize and sorghum grains were weevils (Sitophilus spp.) followed by the Angoumois gelechiid (Sitotroga cerealella Olivier) and flour beetles (Tribolium spp.). High number of insects were recorded from both plastered and un-plastered gombisa and polypropylene bags. Additionally, the amount of every insect pest in each storage container recorded per 100 g grain increased because the duration of grain storage increased. There have been 0.33-1.29g and 0.44-1g of rodent droppings per 100g sample of maize and sorghum grains, respectively. This showed that faecal dropping per 100 g grain increased along with increase in storage period. Grain damage showed significant (P<0.05) differences over the storage periods across the studied districts. A similar trend was observed for weight loss in each of the grains all districts. These results indicated that farmers are incurring a substantial grain loss to insects and rodent pests. Hence, there is an urgent need to devise appropriate tactics for protecting the losses in farm-stored maize and sorghum in Ethiopia.
Keywords:
Published on: Nov 13, 2021 Pages: 35-39
Full Text PDF
Full Text HTML
DOI: 10.17352/ojeb.000024
CrossMark
Publons
Harvard Library HOLLIS
Search IT
Semantic Scholar
Get Citation
Base Search
Scilit
OAI-PMH
ResearchGate
Academic Microsoft
GrowKudos
Universite de Paris
UW Libraries
SJSU King Library
SJSU King Library
NUS Library
McGill
DET KGL BIBLiOTEK
JCU Discovery
Universidad De Lima
WorldCat
VU on WorldCat
PTZ: We're glad you're here. Please click "create a new query" if you are a new visitor to our website and need further information from us.
If you are already a member of our network and need to keep track of any developments regarding a question you have already submitted, click "take me to my Query."